Microscope system for testing semiconductors

United States of America Patent

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Issued Date
Aug 3, 2006
app pub date
Jan 18, 2006
filing date
Jan 31, 2005

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Abandoned

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Abstract

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A system that includes an imaging device for effectively positioning a probe for testing a semiconductor wafer.

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Patent Owner(s)

Patent Owner	Address
CASCADE MICROTECH INC	9100 SW GEMINI DRIVE BEAVERTON OR US 97008

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G21K:TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNET....

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Inventor Name	Address	# of filed Patents	Total Citations
Andrews, Peter	Beaverton, OR	91	2527
Hess, David	Beaverton, OR	36	232

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Microscope system for testing semiconductors

Number of patents in Portfolio can not be more than 2000

United States of America Patent

11335014

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APP PUB NO	20060169897A1
SERIAL NO	11335014
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11335014

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