Measuring device for the measurement of optical properties of coated substrates
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United States of America Patent
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Nov 11, 2008
Grant Date -
Aug 31, 2006
app pub date -
Nov 24, 2004
filing date -
May 22, 2004
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A measuring device includes several sequentially disposed coating chambers for measuring optical properties of coated substrates. These coating chambers are separated from one another by partitioning walls, whose free ends are located closely above the substrate. The substrate is preferably a continuous film. By measuring the reflection, the transmission, etc. of the substrate between the individual coating chambers, it becomes possible to carry out measurements within only partially completed layer systems. This yields advantages for the technical operation control of the coating process.
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