Post deposition plasma cleaning system and method

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United States of America Patent

PATENT NO 8974868
SERIAL NO

11084176

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Abstract

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A method for processing a substrate includes disposing the substrate in a deposition chamber configured to perform a deposition process and depositing a film on the substrate using the deposition process. The substrate having the film thereon is then transferred from the deposition chamber into a treatment chamber and a plasma cleaning process is performed on the substrate in the treatment chamber. Further processing of the substrate is performed after the plasma cleaning process.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 1076325 ?1076325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishizaka, Tadahiro Clifton Park, US 118 6906
Ludviksson, Audunn Scottsdale, US 22 1284

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