Abnormal circuit operation detection system

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United States of America Patent

PATENT NO 7796050
SERIAL NO

11207831

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Abstract

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An abnormality in operation is detected by meticulously monitoring the operation of a monitored device that comprises a state machine. The state number, indicating the state the monitored device is currently in, is output from the device. The upper and lower limit values of current consumption is set for each state number. A monitoring circuit, using the upper and lower limit values for the present state number, judges the value of current consumption detected by a current detection circuit and detects whether there is abnormality in operation.

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Patent Owner(s)

  • FUJITSU LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hashimoto, Chikashi Yokohama, JP 4 12
Hashizume, Masato Yokohama, JP 8 31
Ikeda, Yoshihisa Yokohama, JP 14 67
Iwaki, Hiroyuki Yokohama, JP 41 510
Yasui, Takanori Yokohama, JP 8 47

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