Method and apparatus for measuring temperature
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United States of America Patent
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app pub date -
Apr 24, 2006
filing date -
Jun 21, 2001
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Abandoned
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Abstract
A method for determining concentration of at least one component of the material, the method comprising: measuring at least one of the real and imaginary parts of the permittivity of the material at each of a first plurality of frequencies for which substantially only a second plurality of known components of the material contributes to the dielectric permittivity of the material, wherein for each of the known components the permittivity as a function of temperature is known and the first plurality is greater than the second plurality; determining the concentration of at least one of the known components responsive to a solution of a set of simultaneous equations determined by the first plurality of measurements and the dependence of the permittivities of the known components on temperature.
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