System for testing smart cards and method for same
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United States of America Patent
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Jul 27, 2010
Grant Date -
Dec 7, 2006
app pub date -
May 19, 2006
filing date -
May 19, 2005
priority date (Note) -
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Abstract
A system and method for testing multiple smart card devices in parallel and asynchronously are provided. The system includes a smart card module that may be easily inserted in a digital test system. The smart card module includes multiple smart card instrument channels, each one of which testing a separate smart card device independently and asynchronously from the others. The smart card instrument channels employ a novel modulation technique based on palette waveforms that are formed of transitions between two data bits.
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