Digital signal processing circuit having a pattern circuit for determining termination conditions

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United States of America Patent

PATENT NO 7860915
SERIAL NO

11433332

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Abstract

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A method for detecting a pattern from an arithmetic logic unit (ALU) in an integrated circuit. The method includes the steps of: generating an output from an ALU; bitwise comparing the ALU output to a pattern to produce a first output; inverting the pattern and comparing the ALU output with the inverted pattern to produce a second output; bitwise masking the first and second outputs using a mask of a plurality of masks to produce third and fourth output bits; combining the third and fourth output bits to produce first and a second output comparison bits; and storing the first and second output comparison bits in a memory.

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Patent Owner(s)

Patent OwnerAddress
XILINX INC2100 LOGIC DRIVE SAN JOSE CA 95124

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ching, Alvin Y Sunnyvale, US 25 3484
New, Bernard J Carmel Valley, US 108 15990
Simkins, James M Park City, US 38 3894
Thendean, John M Berkeley, US 17 2052
Vadi, Vasisht Mantra San Jose, US 31 2546
Wong, Anna Wing Wah Santa Clara, US 12 1624
Wong, Jennifer Fremont, US 118 10634

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