Process for erasing chalcogenide variable resistance memory bits

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United States of America Patent

PATENT NO 7233520
APP PUB NO 20070008768A1
SERIAL NO

11176884

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Abstract

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A method of erasing a chalcogenide variable resistance memory cell is provided. The chalcogenide variable resistance memory cell includes a p-doped substrate with an n-well and a chalcogenide variable resistance memory element. The method includes the step of applying to the variable resistance memory element a voltage that is less than a fixed voltage of the substrate. The applied voltage induces an erase current to flow from the p-doped substrate through the n-well and through the variable resistance memory element.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Daley, Jon Boise, ID 32 365

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