Cantilever probe structure for a probe card assembly

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United States of America Patent

APP PUB NO 20070089551A1
SERIAL NO

11529784

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted for contact with the beam such that the beam is cantilevered by the fulcrum.

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Patent Owner(s)

Patent OwnerAddress
SV PROBE PTE LTD29 WOODLANDS INDUSTRIAL PARK E1 #04-01 NORTH TECH LOBBY 1 SINGAPORE 757716

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beatson, David T Kennett Square, PA 36 228
Laurent, Edward North Wales, PA 6 92
Malantonio, Edward L Conshohocken, PA 10 146
Tunaboylu, Bahadir Chandler, AZ 27 382
Williams, Scott R St. George, UT 10 179

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