Ion detection using a pillar chip
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United States of America Patent
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Issued Date -
Apr 26, 2007
app pub date -
Sep 1, 2004
filing date -
Sep 3, 2003
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The present invention provides methods and assemblies for ion detection of samples using a chip with elevated sample zones. The elevated sample zones provide a number of ion detection advantages over chips with non-elevated sample zones. Embodiments of the invention have a number of applications in drug discovery, environmental analyses for tracking and the identification of contaminants, target discovery and/or validation as well as in diagnostics in a clinical setting for staging or disease progression. In addition, the invention may also be used with research and clinical microarray systems and devices.
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