Method for measurement of temperature coefficients of electric circuit components
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United States of America Patent
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Issued Date -
May 17, 2007
app pub date -
Mar 19, 2003
filing date -
Mar 19, 2003
priority date (Note) -
Abandoned
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Abstract
There is described a method and circuit for determining a temperature coefficient of change of a parameter of an electrical component, the method comprising: providing at least one thermally-isolated micro-platform on a substrate; placing an electrical component on the at least one thermally-isolated micro-platform; heating the electrical component; measuring a parameter value of the electrical component at a plurality of temperatures; and determining the temperature coefficient based on the measured parameter values.
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