Methods and apparatus for testing a component
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United States of America Patent
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Mar 30, 2010
Grant Date -
Jun 21, 2007
app pub date -
Dec 21, 2005
filing date -
Dec 21, 2005
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes generating a raw image of a component under test utilizing an eddy current inspection system, decomposing the raw image into a plurality of images wherein each image includes a different frequency component, and reconstructing at least one final image of the component that includes frequency components that are relevant to an eddy current flaw signal.
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