Dynamic phase offset measurement

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United States of America Patent

PATENT NO 7759926
APP PUB NO 20070201543A1
SERIAL NO

11362289

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In one embodiment, a method is provided for measuring a dynamic phase offset between a PLL's input clock and the PLL's feedback input clock, wherein the input clock is spread spectrum modulated in a spread spectrum mode and is not modulated in a static mode. The method includes: in the spread spectrum mode, measuring phase jitter between the input clock and the feedback input clock to form a spread spectrum phase jitter measurement; in the static mode, measuring phase jitter between the input clock and the feedback input clock to form a static phase jitter measurement; and comparing the spread spectrum phase jitter measurement to the static phase jitter measurement to determine the dynamic phase offset.

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Patent Owner(s)

Patent OwnerAddress
LATTICE SEMICONDUCTOR CORPORATION5555 NE MOORE CT HILLSBORO OR 97124

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
France, Michael G Portland, US 8 148
Nikolov, Ludmil Chippenham, GB 16 130

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