Wafer holder, and heater unit and wafer prober provided therewith

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20070205787A1
SERIAL NO

11701416

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A wafer holder with which probing can be performed with little or virtually no noise due to the wafer being shielded from electromagnetic waves; and a wafer prober on which the wafer holder is mounted. The wafer holder of the present invention includes a chuck top for mounting a wafer, and a resistance heat generator for heating the chuck top. At least part of the resistance heat generator is covered by an insulating layer, and an electrically conductive layer is present on an opposite side of the resistance heat generator having the insulating layer. The electrically conductive layer blocks electromagnetic waves that adversely affect inspection. The insulating layer preferably covers the entire surface of the resistance heat generator, and the electrically conductive layer preferably covers the entire surface of the resistance heat generator comprising the insulating layer.

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Patent Owner(s)

Patent OwnerAddress
SUMITOMO ELECTRIC INDUSTRIES LTD5-33 KITAHAMA 4-CHOME CHUO-KU OSAKA-SHI OSAKA 541-0041
SEI HYBRID PRODUCTS INC1-3 SHIMAYA 1-CHOME KONOHANA-KU OSAKA-SHI OSAKA 554-0024

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Awazu, Tomoyuki Itami-shi, JP 92 1702
Itakura, Katsuhiro Itami-shi, JP 29 1525
Nakata, Hirohiko Itami-shi, JP 131 3819
Natsuhara, Masuhiro Itami-shi, JP 106 2312

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