Method of light enhanced atomic layer deposition

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United States of America Patent

PATENT NO 7727912
APP PUB NO 20070218704A1
SERIAL NO

11378270

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Abstract

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A method light enhanced atomic layer deposition for forming a film on a substrate. The method includes disposing the substrate in a process chamber of a light enhanced atomic layer deposition (LEALD) system configured to perform a LEALD process; and depositing a film on the substrate using the LEALD process, where the depositing includes (a) exposing the substrate to a first process material, (b) exposing the substrate to a second process material containing a reducing agent and irradiating the substrate with a first light radiation having either no or at least partial temporal overlap with the exposing of the substrate to the second process material, (c) repeating steps (a) and (b) until the desired film has been deposited. According to one embodiment of the invention, the deposited film can be a TaCN film or a TaC film.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO JAPAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cerio,, Jr Frank M Schenectady, US 20 452
Faguet, Jacques Albany, US 52 4097
Ishizaka, Tadahiro Watervliet, US 118 6906

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