Method for detecting a particle in a nanoimprint lithography system

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United States of America Patent

PATENT NO 7854867
APP PUB NO 20070246850A1
SERIAL NO

11737301

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Abstract

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A method for detecting a particle between a nanoimprint mold assembly and a substrate in a nanoimprint lithography system.

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Patent Owner(s)

  • MOLECULAR IMPRINTS, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Schumaker, Philip D Austin, US 34 576

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