Sensor, Sensor Arrangement and Measuring Method
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United States of America Patent
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Issued Date -
Nov 1, 2007
app pub date -
Nov 13, 2003
filing date -
Nov 13, 2003
priority date (Note) -
Abandoned
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Abstract
The invention relates to a method and a device for detecting the environmental influence on a sensor by means of a variation of an electrical conductivity of a layer of the sensor, a device for detecting the environmental influence on sensors by detecting a variation of the electrical conductivity of a layer of the sensors, and a sensor device for detecting the environmental influence by means of a variation of an electrical conductivity of a layer of the sensor and by detecting a deposition inside the volume or on the surface thereof and/or the interaction of an environmental material or a substance to be measured on the same sensor.
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