QUANTITATIVE ANALYSIS OF SURFACE-DERIVED SAMPLES USING MASS SPECTROMETRY
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United States of America Patent
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Issued Date -
Nov 8, 2007
app pub date -
May 4, 2007
filing date -
May 5, 2006
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Abstract
A substrate incorporating an internal standard facilitates quantitating analytes in a sample by surface-interrogating mass spectrometry techniques without wet chemistry sample preparation. The user disposes a sample to be analyzed onto the surface of the pretreated substrate. Then the sample-bearing solid substrate, which incorporates an internal standard for each analyte to be quantitated, is ready for interrogation.
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