Method and System of Determining Orifice Plate Parameters
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United States of America Patent
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Issued Date -
Jan 17, 2008
app pub date -
Jul 9, 2007
filing date -
Jul 10, 2006
priority date (Note) -
Abandoned
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Abstract
A method and system of determining orifice plate parameters. At least some of the illustrative embodiments are methods comprising installing an orifice plate in a metering tube, and reading parameters of the orifice plate by a flow computer. In some embodiments, the orifice plate comprises a radio frequency identification (RFID) tag, and a flow computer responsible for calculating flow rate and volume reads the RFID tag to determine parameters of the orifice plate, such as aperture diameter.
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