Specimen analyzing method and specimen analyzing apparatus

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United States of America Patent

PATENT NO 8545760
APP PUB NO 20080020481A1
SERIAL NO

11905328

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Abstract

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A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.

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Patent Owner(s)

  • SYSMEX CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iguchi, Satoshi Kobe, JP 67 2379
Matsuo, Naohiko Kobe, JP 15 190
Yamamoto, Norimasa Kobe, JP 37 355
Yamato, Takashi Kakogawa, JP 24 297

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