Non-volatile memory with reduced erase/write cycling during trimming of initial programming voltage

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United States of America Patent

PATENT NO 7606077
APP PUB NO 20080062785A1
SERIAL NO

11531223

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Abstract

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High performance non-volatile memory devices have the programming voltages trimmed for individual types of memory pages and word lines. A group of word lines within each erasable block of memory are tested successive program loops to minimize the problem of incurring excessive number of erase/program cycles. An optimum programming voltage for a given type of memory pages is derived from statistical results of a sample of similar of memory pages.

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Patent Owner(s)

  • SANDISK TECHNOLOGIES LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hook, Charles Moana Patterson , US 8 171
Li, Yan Milpitas , US 1320 19576
Tu, Loc San Jose , US 22 627

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