Socket for test
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United States of America Patent
Stats
-
N/A
Issued Date -
Apr 17, 2008
app pub date -
Sep 11, 2007
filing date -
Sep 12, 2006
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A socket for test includes: a support block, having a first face and a second face different from the first face, and formed with through holes; probes, provided in the through holes, and electrically connected to terminals of a device to be tested provided on a side of the first face and to terminals connected to a testing apparatus provided on a side of the second face, the probes including a first probe for grounding and a second probe different from the first probe; and a first plate member, formed with a first hole corresponding to the first probe and having a smaller diameter than a diameter of the first probe, slots radially extended from the first hole, and a second hole corresponding to the second probe and having a larger diameter than a diameter of the second probe, the first plate member being in electrical contact with the support block.
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