Method and apparatus for evaluating solar cell and use thereof

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United States of America Patent

PATENT NO 7601941
APP PUB NO 20080088829A1
SERIAL NO

11791761

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Abstract

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Disclosed is a method for evaluating the performance of a solar cell which comprises a silicon semiconductor as the main component. This method comprises a current introduction step for introducing a direct current into a solar cell element constituting the solar cell in the forward direction, and an emission sensing step for sensing emission characteristics of the light emitted from the solar cell element due to the current introduction step. By this method, the photoelectric conversion performance of a solar cell can be simply and accurately evaluated without requiring large-sized equipment.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL UNIVERSITY CORPORATION NARA INSTITUTE OF SCIENCE AND TECHNOLOGYIKOMA-SHI NARA 630-0192

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fuyuki, Takashi Ikoma , JP 6 55

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