Annealing-induced extensive solid-state amorphization in metallic films

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United States of America Patent

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12068146

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An thin film alloy based on chemical elements with high glass forming ability is disclosed. The alloy is deposited as a thin film from a source of substantially the same chemical composition. Within the deposited thin film, amorphization is induced extensively up to decades of micrometers in size during controlled annealing. Such controllable extensive amorphization throughout the thin film is useful to regulate the proportion of amorphous phase to crystalline phase, establish the structure/property relationships and thus tailor specific properties.

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NATIONAL TAIWAN OCEAN UNIVERSITYKEELUNG 20224

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Inventor Name Address # of filed Patents Total Citations
Chu, Jinn P Keelung City, TW 23 61
Kuo, Chun-Hsin Hsinchu City, TW 2 7
Lo, Chang-Ting Taipei County, TW 17 159

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