Multi-Point, Multi-Parameter Data Acquisition For Multi-Layer Ceramic Capacitor Testing
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United States of America Patent
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Issued Date -
Jun 5, 2008
app pub date -
Nov 30, 2006
filing date -
Nov 30, 2006
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A method for testing at least one multi-layer ceramic capacitor part includes charging, holding, and/or discharging at least one part with respect to a programmed voltage over a predetermined period of time, periodically measuring at least one value corresponding to quality of each part to be tested while each part is being charged, held, and discharged. The at least one value can be selected from a group consisting of voltage value, current value, leakage current value, capacitance value, dissipation factor value, and any combination thereof. Curves can be digitized from the periodically measured values collected while each part is being charged, held, and discharged with respect to the programmed voltage.
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