Analysis system for analyzing a sample on an analytical test element
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United States of America Patent
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Oct 5, 2010
Grant Date -
Jun 19, 2008
app pub date -
Dec 22, 2007
filing date -
Jun 22, 2005
priority date (Note) -
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status (Latency Note)
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Abstract
The invention relates to an analysis system for analysing a sample on an analytical test element. The analysis system comprises a measuring module for carrying out measurements on the sample on the analytical test element and an optical module which comprises a lens and a diaphragm by which the light can be focused. The lens and the diaphragm of the optical module are combined as one piece in a multi-component injection-molded part.
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