Calibration Method for Infrared Temperature Measuring Instruments
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United States of America Patent
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Issued Date -
Jul 17, 2008
app pub date -
Jan 15, 2007
filing date -
Jan 15, 2007
priority date (Note) -
Abandoned
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Abstract
A calibration method for infrared temperature measuring instruments is disclosed. The calibration method of the present invention comprises the following five steps: (1) Calibrating the heat-flux resistor of an infrared temperature measuring instrument so as to obtain its calibrated resistance value (2) Using a digital multimeter to measure the parameters of the components and relevant circuits of the infrared temperature measuring instrument (3) Placing the infrared temperature measuring instrument in a blackbody radiation furnace so as to measure a single-point parameter of the blackbody radiation amplifier because the blackbody radiation furnace can provide a standard blackbody radiation source (4) Using the linear equation to obtain two additional parameters at two other temperatures so as to obtain a linear curve of the blackbody radiation amplifier (5) Storing the calibrated parameters in the memory of the infrared temperature measuring instrument.
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