Femtosecond spectroscopy using minimum or maximum phase functions

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United States of America Patent

PATENT NO 8150644
APP PUB NO 20080172435A1
SERIAL NO

12056111

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Abstract

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A method determines a transient response of a sample. The method includes providing a measured magnitude of the Fourier transform of a complex electric field temporal profile of a pulse sequence comprising a first pulse indicative of the transient response of the sample and a second pulse. The method further includes providing an estimated phase term of the Fourier transform of the complex electric field temporal profile of the pulse sequence. The method further includes multiplying the measured magnitude and the estimated phase term to generate an estimated Fourier transform of the complex electric field temporal profile of the pulse sequence. The method further includes calculating an inverse Fourier transform of the estimated Fourier transform, wherein the inverse Fourier transform is a function of time. The method further includes calculating an estimated complex electric field temporal profile of the pulse sequence by applying at least one constraint to the inverse Fourier transform.

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Patent Owner(s)

  • THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Digonnet, Michael J F Palo Alto, US 2 0
Kino, Gordon S Stanford, US 118 3969
Ozcan, Aydogan Los Angeles, US 97 1715

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