System for measuring resonant frequency and delay time of quartz crystal microbalance

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United States of America Patent

PATENT NO 7509860
APP PUB NO 20080184801A1
SERIAL NO

11783943

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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This present invention relates to a system for measuring resonant frequency and delay time of the quartz crystal microbalance. The system includes a transistor oscillating circuit, a switch circuit, a comparator circuit, and a control circuit. The transistor oscillating circuit comprises a quartz oscillator for generating an original oscillating signal. The switch circuit is coupled to the transistor oscillating circuit for outputting a start signal to generate the original oscillating signal. The comparator circuit is coupled to the transistor oscillating circuit for transforming the original oscillating signal to a square wave oscillating signal. The control circuit is coupled to the comparator circuit for receiving the square oscillating signal to estimate the resonant frequency and the delay time of the quartz crystal microbalance.

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Patent Owner(s)

Patent OwnerAddress
TATUNG COMPANYNO 22 CHUNGSHAN N RD 3RD SEC TAIPEI 104 R O C

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kuo, Cheng-Hsing Taipei, TW 16 117
Lee, Chao-Fa Taipei, TW 18 124
Yan, Tsong-Rong Taipei, TW 4 10

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