Methods and Devices for Quantitative Analysis of X-Ray Images
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United States of America Patent
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Issued Date -
Sep 11, 2008
app pub date -
May 22, 2008
filing date -
Aug 29, 2000
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The present invention relates to network enabled analysis of x-ray images. Also described are devices comprising calibration phantoms; methods of using these devices; methods of formulating databases containing information regarding x-ray images; the databases themselves; and methods of manipulating the information and databases.
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