Vertical micro probes
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United States of America Patent
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Issued Date -
Oct 2, 2008
app pub date -
Mar 30, 2007
filing date -
Mar 30, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Embodiments of the present invention improve probes and probe assemblies. In one embodiment the present invention includes a micro probe comprising a lower contact end including a lower tip, an upper contact end, and a curved intermediate region between the upper contact end and lower contact end. An angle stop is included between the lower contact end and the curved intermediate region, and the lower contact end, upper contact end, and curved intermediate region have a uniform thickness
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