METHOD AND DEVICE FOR DATA INTEGRITY CHECKING

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United States of America Patent

SERIAL NO

12115410

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Abstract

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The present invention relates to high speed datapaths, sometimes including mixed digital and analog voltage signals. In particular, it relates to error checking strategies for large data volumes, in digital and/or analog domains and to analog signal patterns that accelerate charge loading of micromirrors in an SLM. Particular aspects of the present invention are described in the claims, specification and drawings.

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Patent Owner(s)

Patent OwnerAddress
MICRONIC LASER SYSTEMS ABBOX 3141 NYTROPSVAGEN 9 TABY SE-183 03

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Odselius, Leif Taby, SE 5 37
Olsson, Martin Linkoping, SE 13 169
Sandstrom, Torbjorn Pixbo, SE 95 2628

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