System and method for simultaneous optimization of multiple scenarios in an integrated circuit design
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United States of America Patent
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Issued Date -
Oct 2, 2008
app pub date -
Apr 2, 2007
filing date -
Apr 2, 2007
priority date (Note) -
Abandoned
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Abstract
The present invention provides a system and method for concurrently performing analysis and optimization of an integrated circuit (IC) design in multiple scenarios. The system is based on a distributed computing model, where any optimization change introduced in one scenario is immediately tested in all other scenarios. This ensures that modifications made to the design do not affect other scenarios. The invention significantly reduces the execution time of the optimization and signoff flows in the design of ICs. In addition, the computing means required for simultaneously testing multiple scenarios are standard and affordable.
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