METHOD FOR TEMPERATURE COMPENSATING BIT LINE DURING SENSE OPERATIONS IN NON-VOLATILE STORAGE

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United States of America Patent

APP PUB NO 20080247254A1
SERIAL NO

11772015

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Abstract

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Temperature-compensation is provided during a sense operation of a non-volatile storage element. A gate voltage of a transistor which couples a bit line associated with the non-volatile storage element to a sense module is temperature-compensated so that it is higher when temperature is higher to compensate for variations with temperature of the bit line voltage. The bit line voltage, in turn, varies due to variations in temperature of a threshold voltage of the non-volatile storage element. The sense module determines a programming condition of the non-volatile storage element, which may be provided in a NAND string, by sensing a voltage. The sense operation may be a read operation, verify operation, or erase-verify operation, for instance. Further, the threshold voltage of the non-volatile storage element may be positive or negative. In another aspect, a source voltage is temperature compensated.

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Patent Owner(s)

Patent OwnerAddress
SANDISK TECHNOLOGIES LLC5080 SPECTRUM DRIVE SUITE 1050W ADDISON TX 75001

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Seungpil San Ramon, CA 66 1237
Mui, Man Lung Santa Clara, CA 52 752
Nguyen, Hao Thai San Jose, CA 27 478

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