Systems and methods for creating inspection recipes
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United States of America Patent
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Jan 25, 2011
Grant Date -
Oct 9, 2008
app pub date -
Dec 19, 2007
filing date -
Dec 19, 2006
priority date (Note) -
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status (Latency Note)
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Abstract
Systems and methods for creating inspection recipes are provided. One computer-implemented method for creating an inspection recipe includes acquiring a first design and one or more characteristics of output of an inspection system for a wafer on which the first design is printed using a manufacturing process. The method also includes creating an inspection recipe for a second design using the first design and the one or more characteristics of the output acquired for the wafer on which the first design is printed. The first and second designs are different. The inspection recipe will be used for inspecting wafers after the second design is printed on the wafers using the manufacturing process.
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