POLISHING COMPOUND AND POLISHING METHOD

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United States of America Patent

SERIAL NO

12025156

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Abstract

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To provide a polishing compound that is capable of minimizing formation of scratches on an object to be polished, such as a resin substrate or a metal wiring, and polishing at a high removal rate. To further provide a polishing method that is capable of minimizing formation of scratches on a resin substrate or a metal wiring, and improving the throughput. The polishing compound T comprises an oxidizing agent, an electrolyte and an aqueous medium, wherein ions formed from the electrolyte comprise ammonium ions, at least one type of organic carboxylate ions selected from the group consisting of polycarboxylate ions and hydroxycarboxylate ions, and at least one type of ions selected from the group consisting of carbonate ions, hydrogencarbonate ions, sulfate ions and acetate ions. A wiring trench 2 is formed in a resin substrate 1, then a wiring metal 3 is embedded in the wiring trench 2, and the wiring metal 3 is polished by using the above-mentioned polishing compound, whereby it is possible to minimize formation of scratches on the metal wiring 3 and to improve the throughput.

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Patent Owner(s)

Patent OwnerAddress
ASAHI GLASS COMPANY LIMITEDCHIYODA-KU TOKYO 100-8405
AGC SEIMI CHEMICAL CO LTDCHIGASAKI-SHI KANAGAWA 253-8585

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KAMIYA, Hiroyuki Tokyo, JP 47 948
Tsugita, Katsuyuki Chigasaki-shi, JP 10 69

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