Method for Chemical-Mechanical Planarization of Copper

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United States of America Patent

SERIAL NO

12163385

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Abstract

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Method for polishing copper by chemical-mechanical planarization. The method of the present invention includes dissolving MoO.sub.3 in an oxidizing agent and deionized water to form a first slurry; filtering the first slurry; adding supplemental ceramic/metal oxide nano-particles to the first slurry after filtering, forming an aqueous slurry; introducing the aqueous slurry between the copper and a polishing pad; and, polishing the copper by moving the polishing pad and the copper relative to one another.

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Patent Owner(s)

Patent OwnerAddress
CYPRUS AMAX MINERALS COMPANY333 NORTH CENTRAL AVENUE PHOENIX AS 85004

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Babu, SV Potsdam, NY 4 14
Hegde, Sharath Potsdam, NY 16 111
Hong, Youngki Potsdam, NY 43 152
Jha, Sunil Chandra Oro Valley, AZ 17 146
Patri, Udaya B Potsdam, NY 6 40

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