Error detection for multi-bit memory

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United States of America Patent

PATENT NO 8117520
APP PUB NO 20080313525A1
SERIAL NO

11819000

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Abstract

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Systems, methods, and devices are disclosed, including a device that includes a plurality of data locations, a quantizing circuit coupled to the plurality of data locations, and an error detection module coupled to the quantizing circuit. In some embodiments, the error detection module includes an encoder configured to encode incoming data with redundant data derived from the incoming data and a decoder configured to detect errors in stored data based on the redundant data.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Baker, R Jacob Boise, US 120 2430

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