Photovoltaic Device Characterization Apparatus
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United States of America Patent
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Issued Date -
Jan 1, 2009
app pub date -
Apr 16, 2007
filing date -
May 17, 2006
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The objective is to perform a more detailed failure diagnosis of a photovoltaic device. Provided is a photovoltaic device characterization apparatus including a measurement unit (30, 36, 38, 40, 42, 44, 46, 48, 50) for measuring current-voltage characteristic of a photovoltaic device, a conversion unit (30) for converting the current-voltage characteristic measured with the measurement unit into a prescribed reference condition, a memory (52) for storing a plurality of reference characteristics, and a determination unit (30) for comparing the current-voltage characteristic converted into the reference condition and the reference characteristics read from the memory, and determining to which one of the reference characteristics the current-voltage characteristic is closest.
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