DEVICE AND METHOD FOR IMPROVING THE MEASUREMENT ACCURACY IN AN OPTICAL CD MEASUREMENT SYSTEM

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20090015833A1
SERIAL NO

12127386

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method and a device are disclosed, with which an improvement of the measurement accuracy for the determination of structure data is possible. There is provided a device having a support table (4) movable in the X-coordinate direction and the Y-coordinate direction, on which an additional holder (6) for holding a substrate (2) is carried, having at least one light source (16; 20), at least one objective (8) and a first detector unit (15a) receiving the light transmitted or reflected by structures applied to the substrate (2). There is further provided a polarization means (30a; 30b) associated with the light source (16; 20) and/or located in an optical imaging path (10; 12).

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Patent Owner(s)

Patent OwnerAddress
VISTEC SEMICONDUCTOR SYSTEMS GMBH35781 WEILBURG

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Heiden, Michael Wolfersheim, DE 37 149
Steinberg, Walter Weilmunster-Mottau, DE 5 89

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