System and methods to determine and monitor changes in microstructural properties
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United States of America Patent
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May 17, 2011
Grant Date -
Mar 5, 2009
app pub date -
Mar 28, 2008
filing date -
Mar 15, 2006
priority date (Note) -
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Abstract
A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.
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