Self-learning integrity management system and related methods
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United States of America Patent
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Sep 21, 2010
Grant Date -
Mar 5, 2009
app pub date -
Nov 13, 2008
filing date -
Sep 27, 2006
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Abstract
An integrity management system predicts abnormalities in complex systems before they occur based upon the prior history of abnormalities within the complex system. A topology of the nodes of a complex system is generated and data is collected from the system based on predetermined metrics. In combination with dynamic thresholding, fingerprints of the relevant nodes within a complex system at various time intervals prior to the occurrence of the abnormality are captured and weighted. The fingerprints can then be applied to real-time data provide alerts of potential abnormality prior to their actual occurrence.
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