US Patent Application No: 2009/0065,775

Number of patents in Portfolio can not be more than 2000

TEST-KEY FOR CHECKING INTERCONNECT AND CORRESPONDING CHECKING METHOD

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Abstract

A test key for checking an interconnect structure is described, including a contiguous metal line and multiple conductive plugs on the contiguous metal line, wherein one end of each plug contacts with the contiguous metal line. The other end of at least one plug is not connected to any conductor. In addition, the two ends of the contiguous metal line are connected to different voltages.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
UNITED MICROELECTRONICS CORP.HSINCHU4006

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cheng, Rui-Huang - 8 0
Cheng, Yeh-Sheng Yunlin County, TW 4 0
Chien, Chih-Ying Nantou County, TW 4 0
Liao, Shu-Yun - 4 0
Lu, Hsin-Yu Taichung City, TW 4 0
Wang, Hsueh-Wen Taipei, TW 7 7

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