METHODS AND APPARATUS FOR COST-EFFECTIVELY INCREASING FEATURE DENSITY USING A MASK SHRINKING PROCESS WITH DOUBLE PATTERNING

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United States of America Patent

APP PUB NO 20090087993A1
SERIAL NO

11864901

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Abstract

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Methods and apparatus are provided for forming an array of devices. The invention includes forming a stack of material layers, forming a first hardmask over the plurality of material layers, exposing the first hardmask to ozone mixed with a halogenated additive, forming a protective layer over the first hardmask, forming a second mask on the protective layer shifted relative to the first mask, exposing the second hardmask to ozone mixed with the halogenated additive, and etching the plurality of material layers to remove material not covered by the hardmasks. Numerous other aspects are disclosed.

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Patent Owner(s)

Patent OwnerAddress
SANDISK TECHNOLOGIES LLC6900 DALLAS PARKWAY SUITE 325 PLANO TX 75024

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maxwell, Steven Sunnyvale, US 20 439

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