RELIABLE MEMORY MODULE TESTING AND MANUFACTURING METHOD
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United States of America Patent
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app pub date -
Dec 18, 2008
filing date -
Jan 6, 2000
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Abandoned
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Abstract
A method of testing memory modules comprising jumping through all addressable memory blocks a first and second time is disclosed. Each jumped-to address is determined by first XORing the last two bits of the previous address, and then XORing the first result with a bit representation of the previous jump direction for a second result. The second result determines the direction of the next jump, either upwards or downwards. Each jumped-to address is XORed with its contents, and the result is written to the address. For initially empty and defect-free memory, this results in all 1 values written for the first time jumping, and all 0 values written for the second time jumping. Finally, after the second time jumping, all addressable memory values are checked, and any non-0 value addresses are identified as defective memory cells.
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