Phase Contrast Electron Microscope Device

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United States of America Patent

APP PUB NO 20090166558A1
SERIAL NO

12084955

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A confocal method in which a sample is disposed in the center, a collective lens and a front objective lens are disposed on the incident side, and a back objective lens and a projection lens are disposed symmetrically on the outgoing side is so configured that a spatial filter can be inserted in front of the sample and behind it. As a result, the advantage of the confocal method, which is in the possibility of disposing a spatial filter in front of the sample, is realized and the disadvantages of the conventional transmission phase contrast electron microscope (halo, electron beam loss) are eliminated, thereby providing a phase contrast electron microscope device that enables the establishment of an electron microscopy technology that makes it possible to view of a wide range of materials from material science to life science in a non-dyed state with a high contrast and a high resolution.

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Patent Owner(s)

Patent OwnerAddress
NAGAYAMA IP HOLDINGS LLC145 WEST 57TH STREET NEW YORK NY 10019
INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION NATIONAL INSTITUTES OF NATURAL SCIENCES2-21-1 OSAWA MITAKA-SHI TOKYO 1818588

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nagayama, Kuniaki Aichi , JP 27 283

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