System and Methods for Sample Analysis
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United States of America Patent
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app pub date -
Nov 21, 2008
filing date -
Sep 28, 2004
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Abandoned
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Abstract
The invention encompasses analyzers and analyzer systems that include a single particle analyzer, methods of using the analyzers and analyzers systems to analyze samples, either for single particles or for multiple particles (multiplexing), methods of doing business based on the use of the analyzers or analyzer systems of the system, and electronic media for storing parameters useful in the analyzers and analyzer systems of the invention.
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