Conductive line structure and the method of forming the same

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United States of America Patent

APP PUB NO 20090184425A1
SERIAL NO

12009188

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Abstract

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The conductive line structure of a semiconductor device including a base; at least one patterned conductive layer formed over the base; a conductive line formed over the at least one patterned conductive layer; a protection layer that encompasses the top surface and sidewall of the conductive line to prevent undercut generated by etching. The structure further comprises an underlying layer under the conductive line. The underlying layer includes Ni, Cu or Pt. The conductive line includes gold or copper. The at least one patterned conductive layer includes at least Ti/Cu. The protection layer includes electro-less plating Sn, Au, Ag or Ni.

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Patent Owner(s)

Patent OwnerAddress
ADVANCED CHIP ENGINEERING TECHNOLOGY INCNO 65 GUANGFU N RD HUKOU TOWNSHIP HSINCHU COUNTY 303 R O C

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Ming-Chih Hsinchu City , TW 70 439
Hu, Dyi-Chung Chutung , TW 146 1379
Hu, Yu-Shan Yangmei Township , TW 26 368

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