TWEEZERS SYSTEM FOR SCANNING PROBE MICROSCOPE, SCANNING PROBE MICROSCOPE APPARATUS AND METHOD OF REMOVING DUST

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United States of America Patent

APP PUB NO 20090188011A1
SERIAL NO

12355365

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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To enable to freely interchange a front end shape of a work in accordance with an object of, for example, removing a dust or the like, in addition thereto, even in a case of contaminating a work, to be able to easily deal therewith, and to be able to recognize a defect even when, for example, operated by an operator of a beginner without being governed by a technique of the operator, a tweezers constituted by two arms having probes arranged opposedly to a sample integrated to a scanning probe microscope and constituting an object of observation or working respectively at front ends thereof, and a plurality of kinds of interchanging works one of the plurality of kinds of which is selectively grasped by the tweezers are provided. As the interchanging works, there are an observing stylus work, a work for a contact hole, a corner moving work, a cutting work, a spatula shape work.

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Patent Owner(s)

Patent OwnerAddress
SII NANOTECHNOLOGY INCCHIBA COUNTY CHIBA JAPAN CHIBA-SHI CHIBA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yasutake, Masatoshi Chiba-shi , JP 54 611

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