Impedance-based arc detector for computed tomography scanner and method of use thereof
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United States of America Patent
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Dec 13, 2011
Grant Date -
Aug 27, 2009
app pub date -
Feb 20, 2009
filing date -
Feb 21, 2008
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present disclosure relates to an impedance-based arc detector for CT scanners and method of use and diagnosis therewith, and more specifically, to a two- or three-way conductive probe detector system and associated signal processing unit to distinguish the location of arc faults on a CT scanner at either the high-voltage cable of an x-ray tube, an anode connected to the x-ray tube, a cathode also connected to the x-ray tube, a high-voltage well, or a power distribution unit of the tube.
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